Please use this identifier to cite or link to this item: https://dair.nps.edu/handle/123456789/2440
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dc.contributor.authorLuqi Luqi
dc.contributor.authorValdis Berzins
dc.contributor.authorPaul Dailey
dc.date.accessioned2020-03-16T18:17:46Z-
dc.date.available2020-03-16T18:17:46Z-
dc.date.issued2009-09-30
dc.identifier.citationPublished--Unlimited Distribution
dc.identifier.urihttps://dair.nps.edu/handle/123456789/2440-
dc.descriptionAcquisition Management / NPS Faculty Research
dc.description.abstractThe ability to automate the testing of software is critical in the successful acquisition of future Open Architecture (OA)-based weapon and combat systems. In the OA environment, software modules are reused in different environments, and systems are highly modular in nature. These situations result in increased numbers of potential software configurations. As configurations change and OA software is put in new environments, the potential for finding or creating new bugs increases. The concept of using an operational profile, or environment model that generates inputs to an OA software module, based on probabilistic distributions, to assist in the automated testing process is critical for catching such bugs. This paper describes an ongoing research effort on operational profile models, presents a summary of prior relevant work, and outlines an initial strategy for developing and implementing the operational profile model concept. Following the model acquisition approach, a recommendation for future work is presented.
dc.description.sponsorshipAcquisition Research Program
dc.languageEnglish (United States)
dc.publisherAcquisition Research Program
dc.relation.ispartofseriesOpen Architecture (OA)
dc.relation.ispartofseriesNPS-PM-09-146
dc.subjectOpen Architecture
dc.subjectAutomated Testing
dc.subjectSoftware Testing
dc.subjectOperational Profile
dc.titleDriving Automated Open-Architecture Testing: An Operational Profile Model-development Strategy
dc.typeTechnical Report
Appears in Collections:Sponsored Acquisition Research & Technical Reports

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