Please use this identifier to cite or link to this item:
https://dair.nps.edu/handle/123456789/4174
Title: | Measuring the Technology Transition Performance by Data Envelopment Analysis |
Authors: | Toshiyuki Sueyoshi Youngbok Ryu |
Keywords: | Measuring Technology Transition Performance Data Envelopment Analysis |
Issue Date: | 30-Mar-2020 |
Publisher: | Acquisition Research Program |
Citation: | Published--Unlimited Distribution |
Series/Report no.: | Technology Transition Performance;SYM-AM-20-036 |
Abstract: | This study aims to examine the technology transition efficiency of the U.S. Department of Defense (DoD) Small Business Innovation Research (SBIR) program. To attain it, this study decomposes the process of technology transition into three sub-processes: research and development (R&D), network building, and commercialization. By employing data envelopment analysis (DEA), this study examines the efficiency of each sub-process at firm and agency levels. Subsequently, Tobit regression analyses explore what factors influence the efficiency measures. Based upon the results of DEA and Tobit analyses applied to federal procurement contracts, SBIR awards, and patent data of 252 technology-based small businesses, this study finds that firm-level efficiency ranges from 30% to 60%, while agency-level ones are between 70% and 90%. Commercialization efficiency is relatively higher at the firm level, whereas network building efficiency is relatively higher than others at the agency level. Efficiency-related significant factors include the number of employees, degree of technology distance relative to DoD and prime contractors, location, industrial focus, and primary affiliation with DoD agencies. |
Description: | Acquisition Management / Defense Acquisition Community Contributor |
URI: | https://dair.nps.edu/handle/123456789/4174 |
Appears in Collections: | Annual Acquisition Research Symposium Proceedings & Presentations |
Files in This Item:
File | Description | Size | Format | |
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SYM-AM-20-036.pdf | 488.03 kB | Adobe PDF | View/Open |
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