Please use this identifier to cite or link to this item:
https://dair.nps.edu/handle/123456789/4930
Title: | Using Digital Twins to Tame the Testing of AI |
Authors: | David Zurn, Craig Arndt |
Keywords: | Digital Twin AI/ML Cognitive EW HITL |
Issue Date: | 1-May-2023 |
Publisher: | Acquisition Research Program |
Citation: | APA |
Series/Report no.: | Acquisition Management;SYM-AM-23-163 |
Abstract: | Program test managers and test engineers should carefully consider Digital Twinning approaches for addressing training and testing challenges for Artificial Intelligence/Machine Learning (AI/ML) systems. A hybrid Hardware in the Loop (HITL) and Digital Twin (DT) architecture is discussed for a notional Cognitive EW system. This architecture may provide effective training and testing for complex AI/ML systems that incorporate extensive Cyber-Physical interactions. Considerations for generating realistic RF test environments for Cognitive EW systems are also considered. |
Description: | SYM Presentation |
URI: | https://dair.nps.edu/handle/123456789/4930 |
Appears in Collections: | Annual Acquisition Research Symposium Proceedings & Presentations |
Files in This Item:
File | Description | Size | Format | |
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SYM-AM-23-163.pdf | 1.39 MB | Adobe PDF | View/Open |
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