Please use this identifier to cite or link to this item: https://dair.nps.edu/handle/123456789/4931
Title: Shifting Left: Opportunities to Reduce Defense Acquisition Cycle Time by Fully Integrating Test and Evaluation in Model Based Systems Engineering
Authors: Craig Arndt, Awele Anyanhun
Jeremy S. Werner
Keywords: Digital Engineering
MBSE
Test planning
Shift left
Issue Date: 1-May-2023
Publisher: Acquisition Research Program
Citation: APA
Series/Report no.: Acquisition Management;SYM-AM-23-164
Abstract: The reduction in cycle time for acquisition programs, or “Shift Left” is important to realizing the benefits of digital engineering (DE), as specifically addressed in the DOT&E Strategy update in 2022. Although DE has long held the promise of making programs faster, and achieving goals and priorities more efficiently, its effect on reduced acquisition cycle time is still difficult to identify and quantify. Furthermore, problem discovery during testing and evaluation (T&E) has been identified as a critical driver in the time it takes to develop systems and is said to have significant impact on the acquisition cycle time. Hence, a reduction in acquisition cycle time can be achieved through a systemic approach that positively impacts the time required to test systems while maintaining or reducing risk. Therefore, expanding the use of DE and model-based systems engineering (MBSE) to include test capability models creates the opportunity to improve testing and development of defense systems as well as reduce the defense acquisition life cycle time. To this end, this paper will present the quantitative results of a project that expands the use of MBSE within the test and evaluation space through the creation of a model-based test integration prototype. The results will show where and how test modeling can be used to impact acquisition decision making and reduce overall program schedule.
Description: SYM Presentation
URI: https://dair.nps.edu/handle/123456789/4931
Appears in Collections:Annual Acquisition Research Symposium Proceedings & Presentations

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