Please use this identifier to cite or link to this item:
https://dair.nps.edu/handle/123456789/4937
Title: | Development of Digital Engineering Artifacts in support of MBSE-based Test Planning, Execution, and Acquisition Decision Making |
Authors: | Jeremy S. Werner, Craig Arndt |
Keywords: | Model Based System Engineering Acquisition artifacts Model based test planning Digital TEMP |
Issue Date: | 1-May-2023 |
Publisher: | Acquisition Research Program |
Citation: | APA |
Series/Report no.: | Acquisition Management;SYM-AM-23-170 |
Abstract: | In order to effectively implement MBSE in all aspects of testing and in system engineering for the department of defense we need to create models of the acquisition system (acquisition process, as described by the acquisition pathways), models of the critical acquisition artifacts (CDD, RFP, Acq Strategy, SEP, TEMP, AoA, etc.), and key events (technical reviews (SFR, PDR, CDR, TRR etc.). Many related efforts are underway throughout the DOD and DOT&E’s Strategic Initiatives, Policy, and Emerging Technologies (SIPET) division has sponsored Model-Based TEMP (MBTEMP) Workshops at Johns Hopkins University Applied Physics Laboratory (JHU/APL) in July 2022 and Feb 2023 to foster collaboration and knowledge exchange to advance MBSE for T&E. |
Description: | SYM Presentation |
URI: | https://dair.nps.edu/handle/123456789/4937 |
Appears in Collections: | Annual Acquisition Research Symposium Proceedings & Presentations |
Files in This Item:
File | Description | Size | Format | |
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SYM-AM-23-170.pdf | 3.34 MB | Adobe PDF | View/Open |
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